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Publications 'Design for Test & Manufacture in sub-wavelength technologies’ Guest lecture, Institute of System level Integration, Scotland, January 2006. 'Solving DSM Test Challenges’ Paper presentation at EuroDesign Conference, October 2004, Munich, Germany. 'The Test paradigm for Deep sub-micron’ Participated as part of a panel of industry experts to address the subject of industry roadmaps and requirements to enable Deep sub-Micron Design for Test and Design for Manufacture. Date 2004, Paris. 'Enabling LogicBIST with DFTAdvisor and FastScan' Logic BIST based white paper and conference proceedings presented at the Silicon Valley Mentor Users Group (SVMUG) in San Jose, April 30, May 1, 2001.
Presentation and conference proceeding submission. White paper to address a Jennic development for 'DfT - SoC and reuse' 'Silicon Integration of Intellectual Property' F&M (German electronic magazine), July 1999. What is SCCAD? Spectrum, July 1998. 'Post-placement scan chain re-ordering' F&M (German electronic magazine), November 1996. |
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